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Nanoscale structural analysis of amorphous materials

Abstract:
Reduced density function (G(r)) analysis of energy filtered electron diffraction data provides structural information from small volumes of amorphous materials. Improvements in transmission electron microscopes, energy filters and data recording devices (CCDs) have made it possible to perform G(r) analysis from volumes as small as 1-2 nm in diameter.
Publication status:
Published

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Authors


McBride, W More by this author
Cockayne, DJH More by this author
Issue:
168
Pages:
103-106
Publication date:
2001
ISSN:
0951-3248
URN:
uuid:fc11aa99-88dc-40d3-a3a3-887320bb6b34
Source identifiers:
11711
Local pid:
pubs:11711
ISBN:
0-7503-0812-5

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