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Thesis

X-ray diffraction topography : methods and applications

Abstract:

This thesis describes the application of the well established technique of X-ray diffraction topography to a variety of problems, and includes considerations of the optimum conditions for taking rapid topographs.

Chapter I contains a brief review of the subject together with an indication of the range of applicability. Several modifications of X-ray topography exist and several are briefly described to illustrate the principles and mechanisms of image formation. Contrast is formed ...

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Institution:
University of Oxford
Oxford college:
Oriel College
Department:
Oxford, Department of Metallurgy
Role:
Author

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Role:
Supervisor
Publication date:
1971
Type of award:
DPhil
Level of award:
Doctoral
Awarding institution:
University of Oxford
Barcode:
601870697
URN:
uuid:fa8aa052-81f4-4a5b-918d-b70c0cc6b934
Local pid:
td:601870697
Language:
English

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