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Prospective applications for a double-C-s-corrector TEM/STEM

Abstract:
From a systematic review of the various aberration-affected disciplines of TEM and STEM, we deduce the most promising applications for a new microscope featuring both C-s-corrected condenser and objective lens optics. The phase contrast and nonlinear image contrast formation mechanisms require different justifications for C-s-correction compared to the light-optical analogue.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
ELECTRON MICROSCOPY AND ANALYSIS 2001 More from this journal
Issue:
168
Pages:
27-30
Publication date:
2001-01-01
Event title:
Conference of the Electron-Microscopy-and Analysis-Group
ISSN:
0951-3248
ISBN:
0750308125
Keywords:
Pubs id:
pubs:23611
UUID:
uuid:f994b4bd-7f38-4740-b372-9d048bb10fe4
Local pid:
pubs:23611
Source identifiers:
23611
Deposit date:
2012-12-19

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