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Journal article

Heating rate and electrode charging measurements in a scalable, microfabricated, surface-electrode ion trap

Abstract:
We characterise the performance of a surface-electrode ion "chip" trap fabricated using established semiconductor integrated circuit and micro-electro-mechanical-system (MEMS) microfabrication processes which are in principle scalable to much larger ion trap arrays, as proposed for implementing ion trap quantum information processing. We measure rf ion micromotion parallel and perpendicular to the plane of the trap electrodes, and find that on-package capacitors reduce this to <~ 10 nm in amplitude. We also measure ion trapping lifetime, charging effects due to laser light incident on the trap electrodes, and the heating rate for a single trapped ion. The performance of this trap is found to be comparable with others of the same size scale.
Publication status:
Published

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Publisher copy:
10.1007/s00340-011-4788-5

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Atomic & Laser Physics
Role:
Author


Journal:
Appl. Phys. B More from this journal
Volume:
107
Issue:
4
Pages:
913
Publication date:
2012-06-01
DOI:
EISSN:
1432-0649
ISSN:
0946-2171


Language:
English
Keywords:
Pubs id:
pubs:206380
UUID:
uuid:f8df9371-2a21-4b34-8772-203a0028cc5e
Local pid:
pubs:206380
Source identifiers:
206380
Deposit date:
2012-12-19

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