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NanoSIMS imaging and analysis in materials science

Abstract:

High-resolution SIMS analysis can be used to explore a wide range of problems in material science and engineering materials, especially when chemical imaging with good spatial resolution (50–100 nm) can be combined with efficient detection of light elements and precise separation of isotopes and isobaric species. Here, applications of the NanoSIMS instrument in the analysis of inorganic materials are reviewed, focusing on areas of current interest in the development of new materials and degra...

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Publication status:
Published
Peer review status:
Peer reviewed

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
ORCID:
0000-0002-9278-6463
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Publisher:
Annual Reviews
Journal:
Annual Review of Analytical Chemistry More from this journal
Volume:
13
Pages:
273-292
Publication date:
2020-02-04
DOI:
EISSN:
1936-1335
ISSN:
1936-1327
Pmid:
32040924
Language:
English
Keywords:
Pubs id:
1087426
Local pid:
pubs:1087426
Deposit date:
2020-04-14

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