Journal article

AFM investigation of Martian soil simulants on micromachined Si substrates.

Abstract:: The micro and nanostructures of Martian soil simulants with particles in the micrometre-size range have been studied using a combination of optical and atomic force microscopy (AFM) in preparation for the 2007 NASA Phoenix Mars Lander mission. The operation of an atomic force microscope on samples of micrometre-sized soil particles is a poorly investigated area where the unwanted interaction between the scanning tip and loose particles results in poor image quality and tip contamination by th...
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APA Style

Vijendran, S., Sykulska, H., & Pike, W. (2007). AFM investigation of Martian soil simulants on micromachined Si substrates. Journal of Microscopy, 227(Pt 3), 236–245.

MLA Style

Vijendran, S., et al. “AFM Investigation of Martian Soil Simulants on Micromachined Si Substrates.” Journal of Microscopy, vol. 227, no. Pt 3, 2007, pp. 236–45.

Chicago Style

Vijendran, S, H Sykulska, and W Pike. 2007. “AFM Investigation of Martian Soil Simulants on Micromachined Si Substrates.” Journal of Microscopy 227 (Pt 3): 236–45.
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Publisher copy:: 10.1111/j.1365-2818.2007.01806.x

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+ Vijendran, S More by this author

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+ Sykulska, H More by this author

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+ Pike, W More by this author

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Bibliographic Details

Journal:: Journal of microscopy More from this journal
Volume:: 227
Issue:: Pt 3
Pages:: 236-245
Publication date:: 2007-09-01
DOI:: 10.1111/j.1365-2818.2007.01806.x
EISSN:: 1365-2818
ISSN:: 0022-2720

Item Description

Language:: English
Pubs id:: pubs:195999
UUID:: uuid:f4d4b78c-90d7-4a09-8673-175027e32faa
Local pid:: pubs:195999
Source identifiers:: 195999
Deposit date:: 2012-12-20

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Copyright date:: 2007

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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