Journal article icon

Journal article

Optimized conditions for imaging the effects of bonding charge density in electron microscopy.

Abstract:

We report on the observability of valence bonding effects in aberration-corrected high resolution electron microscopy (HREM) images along the [010] projection of the mineral Forsterite (Mg₂SiO₄). We have also performed exit wave restorations using simulated noisy images and have determined that both the intensities of individual images and the modulus of the restored complex exit wave are most sensitive to bonding effects at a level of 25% for moderately thick samples of 20-25 nm. This relati...

Expand abstract
Publication status:
Published

Actions


Access Document


Authors


Kirkland, AI More by this author
Journal:
Ultramicroscopy
Volume:
111
Issue:
7
Pages:
901-911
Publication date:
2011-06-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:eda500af-102f-4074-830b-7a36c019bd9b
Source identifiers:
305715
Local pid:
pubs:305715

Terms of use


Metrics



If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP