Optimized conditions for imaging the effects of bonding charge density in electron microscopy.
We report on the observability of valence bonding effects in aberration-corrected high resolution electron microscopy (HREM) images along the  projection of the mineral Forsterite (Mg₂SiO₄). We have also performed exit wave restorations using simulated noisy images and have determined that both the intensities of individual images and the modulus of the restored complex exit wave are most sensitive to bonding effects at a level of 25% for moderately thick samples of 20-25 nm. This relati...Expand abstract
- Publication status:
- Publisher copy:
- Copyright date: