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Determination of X-ray flux using silicon pin diodes

Abstract:

Accurate measurement of photon flux from an X-ray source, a parameter required to calculate the dose absorbed by the sample, is not yet routinely available at macromolecular crystallography beamlines. The development of a model for determining the photon flux incident on pin diodes is described here, and has been tested on the macromolecular crystallography beamlines at both the Swiss Light Source, Villigen, Switzerland, and the Advanced Light Source, Berkeley, USA, at energies between 4 and ...

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Publisher copy:
10.1107/S0909049508040429

Authors


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Institution:
Swiss Light Source, Paul Scherrer Institute, Villigen PSI, Switzerland
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Institution:
"University of California, San Francisco, CA, USA", "Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, USA"
Department:
Department of Biochemistry and Biophysics
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Institution:
Swiss Light Source, Paul Scherrer Institute, Villigen PSI, Switzerland
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Institution:
University of Oxford
Research group:
Laboratory of Molecular Biophysics
Department:
Medical Sciences Division - Biochemistry
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Funding agency for:
James M. Holton
Publisher:
International Union of Crystallography Publisher's website
Journal:
Journal of Synchrotron Radiation Journal website
Volume:
16
Issue:
2
Pages:
143-151
Publication date:
2009-03-05
DOI:
ISSN:
0909-0495
URN:
uuid:e6d254ef-1c8b-4bd6-9fdd-13b8aaedb8f3
Local pid:
ora:5470

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