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Focused ion-beam milling for field-ion specimen preparation: preliminary investigations

Publication status:: Published

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APA Style

Larson, D., Foord, D., Petford-Long, A., Anthony, T., Rozdilsky, I., Cerezo, A., & Smith, G. (1998). Focused ion-beam milling for field-ion specimen preparation: preliminary investigations. ULTRAMICROSCOPY, 75(3), 147–159.

MLA Style

Larson, D., et al. “Focused Ion-Beam Milling for Field-Ion Specimen Preparation: Preliminary Investigations.” ULTRAMICROSCOPY, vol. 75, no. 3, 1998, pp. 147–59.

Chicago Style

Larson, D, D Foord, A Petford-Long, T Anthony, I Rozdilsky, A Cerezo, and G Smith. 1998. “Focused Ion-Beam Milling for Field-Ion Specimen Preparation: Preliminary Investigations.” ULTRAMICROSCOPY 75 (3): 147–59.
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Publisher copy:: 10.1016/S0304-3991(98)00058-8

Authors

+ Larson, D More by this author

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+ Foord, D More by this author

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+ Petford-Long, A More by this author

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+ Anthony, T More by this author

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+ Rozdilsky, I More by this author

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Journal:: ULTRAMICROSCOPY More from this journal
Volume:: 75
Issue:: 3
Pages:: 147-159
Publication date:: 1998-12-01
DOI:: 10.1016/S0304-3991(98)00058-8
ISSN:: 0304-3991

Keywords:: field-ion microscopy

specimen preparation and handling
Pubs id:: pubs:17099
UUID:: uuid:e42e77aa-4f37-4f30-9e95-3b224ca89a07
Local pid:: pubs:17099
Source identifiers:: 17099
Deposit date:: 2012-12-19

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Copyright date:: 1998

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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