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Journal article

3D atom probe applications: past present and future

Abstract:
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

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Publisher copy:
10.1017/S1431927605505671
Journal:
Microscopy and Microanalysis
Volume:
11
Issue:
Supplement 02
Pages:
94 - 95
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
URN:
uuid:e0ed22cc-7322-40e4-870f-24b36028647a
Local pid:
ora:912
Language:
English
Keywords:
Subjects:

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