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Erratum: A study of (111) oriented epitaxial thin films of In 2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction (Journal of Materials Research (2012) 27 (2257-2264) DOI: 10.1557/jmr.2012.162)

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Publisher copy:
10.1557/jmr.2012.270

Authors


Regoutz, A More by this author
Zhang, KHL More by this author
More by this author
Institution:
University of Oxford
Department:
Oxford, MPLS, Chemistry, Inorganic Chemistry
Wermeille, D More by this author
Cowley, RA More by this author
Journal:
Journal of Materials Research
Volume:
27
Issue:
18
Pages:
2447-2447
Publication date:
2012-10-14
DOI:
EISSN:
2044-5326
ISSN:
0884-2914
URN:
uuid:dfbdfe38-16d1-404c-8119-1622311291bf
Source identifiers:
396066
Local pid:
pubs:396066
Language:
English

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