Synchrotron radiation studies of the growth and beam damage of tin-phthalocyanine on GaAs(001)-1x6 substrates

Journal article

The tunability of synchrotron radiation is exploited to probe the structural properties of SnPc films deposited on a GaAs(001) surface. Soft X-ray photoelectron spectroscopy (SXPS) shows that the organic adlayer is weakly interacting with the surface and that the growth mode is Stranski-Krastanov. Near edge X-ray absorption fine structure (NEXAFS) shows that the plane of SnPc molecules in a thick adlayer is close to parallel with the substrate. High photon flux 'beam damage' is apparent in an increased binding energy of the Sn4d core level. © 2004 Elsevier B.V. All rights reserved.

Authors: Cabailh, G; Wells, J; McGovern, I; Vearey-Roberts, A; Bushell, A

• Publication status: Published
• Journal: APPLIED SURFACE SCIENCE
• Volume: 234
• Issue: 1-4
• Pages: 144-148
• Publication date: 2004-07-15
• DOI: 10.1016/j.apsusc.2004.05.069
• ISSN: 0169-4332
• Language: English
• Keywords: NEXAFS; SnPc; organic molecules; beam damage; GaAs; PES; phthalocyanine; SXPS