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Multiple film plane diagnostic for shocked lattice measurements (invited)

Abstract:

Laser-based shock experiments have been conducted in thin Si and Cu crystals at pressures above the Hugoniot elastic limit. In these experiments, static film and x-ray streak cameras recorded x rays diffracted from lattice planes both parallel and perpendicular to the shock direction. These data, showed uniaxial compression of Si(100) along the shock direction and three.-dimensional compression of Cu(100). In the case of the Si diffraction, there was a multiple wave structure observed, which ...

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Publication status:
Published

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Publisher copy:
10.1063/1.1538325

Authors


Kalantar, DH More by this author
Caturla, M More by this author
Lorenz, KT More by this author
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Volume:
74
Issue:
3
Pages:
1929-1934
Publication date:
2003-03-05
DOI:
ISSN:
0034-6748
URN:
uuid:dd65f5eb-29fe-4ca6-8b01-cd8de74e45cf
Source identifiers:
13815
Local pid:
pubs:13815

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