Journal article
CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
- Publication status:
- Published
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Authors
Bibliographic Details
- Journal:
- MICRON
- Volume:
- 24
- Issue:
- 3
- Pages:
- 257-264
- Publication date:
- 1993-01-01
- DOI:
- ISSN:
-
0968-4328
- Source identifiers:
-
13164
Item Description
- Keywords:
- Pubs id:
-
pubs:13164
- UUID:
-
uuid:dba086e8-a780-4ece-8909-76dbb17e267c
- Local pid:
- pubs:13164
- Deposit date:
- 2012-12-19
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- Copyright date:
- 1993
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