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Journal article

High resolution mapping of strains and rotations using electron backscatter diffraction

Abstract:

The angular resolution of electron backscatter diffraction (EBSD) measurements can be significantly improved using an analysis based on determination of small shifts in features from one pattern to the next using cross-correlation functions. Using pattern shift measurements at many regions of the pattern, errors in the best fit strain and rotation tensors can be reduced. The authors show that elements of the strain tensor and small misorientations can be measured to ±10 ...

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Publication status:
Published

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Publisher copy:
10.1179/174328406X130966

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Journal:
MATERIALS SCIENCE AND TECHNOLOGY
Volume:
22
Issue:
11
Pages:
1271-1278
Publication date:
2006-11-05
DOI:
EISSN:
1743-2847
ISSN:
0267-0836
URN:
uuid:d9f909f1-599f-42ed-82df-8cd895ae4d06
Source identifiers:
25524
Local pid:
pubs:25524
Language:
English
Keywords:

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