KMOS: Assembly, integration and testing of three 0.8-2.5 micron spectrographs (Proceedings of SPIE - The International Society for Optical Engineering, 2010)

(untitled) - Masters, R; Lewis, I; Tosh, I; Tecza, M; Lynn, J; Watkins, R; Clack, A; Davies, R; Thatte, N; Tacon, M; Makin, R; Temple, J; et al.