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Quantitative grain boundary analysis of bulk samples by SIMS

Abstract:

Solute grain boundary (GB) segregation is an important metallurgical phenomenon that has been extensively studied over the last 40 years, especially by Auger spectroscopy of fractured surfaces. More recently, it has been demonstrated that high-resolution SIMS (NanoSIMS) analysis can detect solute GB segregation on a simple polished cross-section. The aim of the work presented here was to demonstrate the use of SIMS to achieve quantitative analysis of GB segregation, including taking into acco...

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Publication status:
Published

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Publisher copy:
10.1002/sia.4884

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
SURFACE AND INTERFACE ANALYSIS More from this journal
Volume:
45
Issue:
1
Pages:
305-308
Publication date:
2013-01-01
DOI:
EISSN:
1096-9918
ISSN:
0142-2421
Language:
English
Keywords:
Pubs id:
pubs:316679
UUID:
uuid:d5ddc51d-9137-414c-8ecc-f84ebb8cc86b
Local pid:
pubs:316679
Source identifiers:
316679
Deposit date:
2013-11-17

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