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A Bloch wave analysis of optical sectioning in aberration-corrected STEM.

Abstract:

The reduction in the focal depth of field that occurs through the use of larger apertures in aberration-corrected STEM allows three-dimensional information to be retrieved by optical depth sectioning. This paper explores depth sectioning in zone-axis crystals using Bloch wave calculations. By decomposing the calculation into the contribution from individual states and from individual partial plane waves in the convergent cone of illumination, we explain the form of the electron intensity in t...

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Publication status:
Published

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Authors


Cosgriff, EC More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Journal:
Ultramicroscopy
Volume:
107
Issue:
8
Pages:
626-634
Publication date:
2007-08-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:d30e276a-82b0-4193-8357-04c7d09cba02
Source identifiers:
24344
Local pid:
pubs:24344

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