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Conference item

High-angle annular dark field imaging simulation and its Debye-Waller factor dependence

Publication status:
Published

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Journal:
ELECTRON MICROSCOPY 1998, VOL 2 More from this journal
Pages:
577-578
Publication date:
1998-01-01
Event title:
14th International Congress on Electron Microscopy
ISBN:
0750305657
Pubs id:
pubs:28884
UUID:
uuid:d2cba80c-49bf-495b-b77d-b071f6073f53
Local pid:
pubs:28884
Source identifiers:
28884
Deposit date:
2012-12-19

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