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Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy

Abstract:

The mechanism of image contrast formation in aberration-corrected scanning confocal electron microscopy (SCEM) is studied. Studies of image formation mechanism in high-resolution SCEM have been based on the application of a linear imaging theory from confocal optical microscopy, the wave function formulation used for STEM, and imaging within a Bloch wave framework. Mitsuishi and co-researchers approached SCEM imaging within the framework of Bloch wave theory. The SCEM images were shown to be ...

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Publication status:
Published

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Authors


Cosgriff, EC More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
D'Alfonso, AJ More by this author
Findlay, SD More by this author
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Journal:
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 162
Volume:
162
Issue:
C
Pages:
45-76
Publication date:
2010
DOI:
ISSN:
1076-5670
URN:
uuid:d12b0fc3-f53e-45ca-8bc5-4c452beef79a
Source identifiers:
65951
Local pid:
pubs:65951
Language:
English

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