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Initial results from a simultaneous pyrometry and reflectivity diagnostic

Abstract:
Pyrometry is an established technique used in high strain rate experiments (such as plate impact experiments) whereby the temperature of a sample is determined from the measurement of collected thermal radiation. By applying Planck's Law, ra-diometry data can be used to determine temperature. A significant source of uncertainty in applying pyrometry to high strain rate experiments is due to possible changes in emissivity after a sample has been shocked; thus it is desirable to determine emissivity during the experiment. Kirchhoff's Law, which states emissivity is the complement of reflectivity, can be applied to determine emissivity in high strain rate experiments. Ideally the sample's reflectivity would be measured at the same wavelength and on the same experiment as the pyrometry measurement. A diagnostic has been developed which produces a modulated reflectivity signal that is insensitive to tilt and surface finish. Following characterisation of the system in the laboratory, dynamic tests were conducted. During the dynamic tests, the reflectivity signal was multiplexed onto the radiance signal allowing simultaneous measurement of radiance and reflectivity. A description of the diagnostic, results from laboratory testing and results and analysis from dynamic experiments are presented.
Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1063/1.5044950

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
ORCID:
0000-0002-3535-5624


Publisher:
AIP Publishing
Host title:
Shock Compression of Condensed Matter -2017: Proceedings of the Conference of the American Physical Society Topical Group on Shock Compression of Condensed Matter
Journal:
20th Biennial APS Conference on Shock Compression of Condensed Matter (SCCM 2017) More from this journal
Volume:
1979
Issue:
1
Article number:
130005
Publication date:
2018-07-03
DOI:
EISSN:
1551-7616
ISSN:
0094-243X
ISBN:
9780735416932


Pubs id:
pubs:905136
UUID:
uuid:cfb2fd95-5f0a-47c1-878a-66646a826815
Local pid:
pubs:905136
Source identifiers:
905136
Deposit date:
2019-01-07

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