N-type doping in CdO ceramics: a study by EELS and photoemission spectroscopy

Journal article

Ceramic samples of yttrium- and indium-doped CdO (Cd 1-xY xO with 0≤x≤0.035 and Cd 1-xIn xO with 0≤x≤0.023) have been studied by electron energy loss spectroscopy (EELS) and ultraviolet and X-ray photoemission spectroscopy (UPS and XPS). Both In and Y act as efficient n-type dopants, although the carrier concentration is higher in In-doped material. The maximum surface plasmon loss energy in EELS i...

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Authors: Dou, Y; Egdell, R; Walker, T; Law, D; Beamson, G

• Publication status: Published
• Journal: SURFACE SCIENCE
• Volume: 398
• Issue: 1-2
• Pages: 241-258
• Publication date: 1998-02-10
• DOI: 10.1016/S0039-6028(98)80028-9
• ISSN: 0039-6028
• Language: English
• Keywords: polycrystalline surfaces; X-ray photoelectron spectroscopy; ultraviolet photoelectron spectroscopy; photoelectron spectroscopy; plasmons; cadmium oxide; surface segregation; electron energy loss spectroscopy; ceramics