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Fabrication yield analysis and emission failure investigation of silicon field emission arrays

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Publisher copy:
10.1109/IVNC.2005.1619539

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Volume:
2005
Pages:
169-170
Publication date:
2005-01-01
DOI:
URN:
uuid:ccd3394e-6871-4466-9318-8c48cb917364
Source identifiers:
151414
Local pid:
pubs:151414
ISBN-10:
0780383974
ISBN-13:
9780780383975

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