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Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions.

Abstract:

In Part I of this series of two papers, we demonstrated the formation of a high efficiency phase-contrast image at atomic resolution using a pixelated detector in the scanning transmission electron microscope (STEM) with ptychography. In this paper we explore the technique more quantitatively using theory and simulations. Compared to other STEM phase contrast modes including annular bright field (ABF) and differential phase contrast (DPC), we show that the ptychographic phase reconstruction m...

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Ultramicroscopy More from this journal
Publication date:
2014-11-01
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
Language:
English
Keywords:
Pubs id:
pubs:493177
UUID:
uuid:cc6332a8-f00b-4aff-8748-4a086eb116d6
Local pid:
pubs:493177
Source identifiers:
493177
Deposit date:
2014-12-19

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