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Interfacial diffusion studies in Co-Pd layered films

Abstract:
Position-sensitive atom probe microanalysis has been used to study diffusion in Co-Pd bilayers and multilayer films. Diffusion coefficients have been determined and the effect of grain boundaries on diffusion rates have been assessed.
Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
PetfordLong, AK More by this author
Volume:
156
Issue:
1-3
Pages:
83-84
Publication date:
1996-04-05
DOI:
ISSN:
0304-8853
URN:
uuid:cc11fe22-b48e-4870-bb89-3dc63c6683db
Source identifiers:
29973
Local pid:
pubs:29973

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