Conference item
ON THE MEASUREMENT AND INTERPRETATION OF RESIDUAL STRESS AT THE MICRO-SCALE
- Abstract:
-
In the present paper we consider two representative methods for residual stress evaluation at the micro-scale: a (semi-)destructive method involving material removal and the measurement of strain relief; and a non-destructive X-ray diffraction technique involving the use of micro-focused synchrotron X-ray beam. A recently developed strain relief approach is described using a Focused Ion Beam (FIB) to create a circular trench of progressively increasing depth around a circular "island". Residu...
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- Publication status:
- Published
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Bibliographic Details
- Host title:
- INTERNATIONAL JOURNAL OF MODERN PHYSICS B
- Volume:
- 24
- Issue:
- 1-2
- Pages:
- 1-9
- Publication date:
- 2010-01-20
- DOI:
- EISSN:
-
1793-6578
- ISSN:
-
0217-9792
Item Description
- Keywords:
- Pubs id:
-
pubs:63791
- UUID:
-
uuid:cb233e61-7da1-4e47-862c-19914dffc433
- Local pid:
- pubs:63791
- Source identifiers:
-
63791
- Deposit date:
- 2012-12-19
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- Copyright date:
- 2010
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