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The role of atomic scale investigation in the development of nanoscale materials for information storage applications.

Abstract:

It is well established that the response of devices based on the giant magnetoresistance (GMR) effect depends critically on film microstructure, with parameters such as interfacial abruptness, the roughness and waviness of the layers, and grain size being crucial. Such devices have applications in information storage systems, and are therefore of great technological interest as well as being of fundamental scientific interest. The layers must be studied at high spatial resolution if the micro...

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Publication status:
Published

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Publisher copy:
10.1017/S1431927604040528

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada More from this journal
Volume:
10
Issue:
3
Pages:
366-372
Publication date:
2004-06-01
Event title:
Microscopy and Microanalysis 2002 Meeting
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Keywords:
Pubs id:
pubs:28718
UUID:
uuid:cb1a4222-7d64-4fea-85f7-68ddd313381b
Local pid:
pubs:28718
Source identifiers:
28718
Deposit date:
2012-12-19

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