Journal article
Microstrain distributions in polycrystalline thin film measured by X-ray microdiffraction
- Abstract:
-
Microstrain distributions were acquired in functional thin films by high resolution X-ray microdiffraction measurements, using a polycrystalline CuInSe2 thin film as model system. This technique not only provides spatial resolutions at the submicrometer scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe2 grains were determined to be in the order of 10-4. These values confirmed corresponding microstrain di...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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Funding
Bibliographic Details
- Publisher:
- International Union of Crystallography Publisher's website
- Journal:
- Journal of Applied Crystallography Journal website
- Volume:
- 49
- Issue:
- 2
- Pages:
- 632-635
- Publication date:
- 2016-01-01
- Acceptance date:
- 2016-02-24
- DOI:
- EISSN:
-
1600-5767
- ISSN:
-
0021-8898
Item Description
- Keywords:
- Pubs id:
-
pubs:606337
- UUID:
-
uuid:c9bf2956-1dba-4559-8748-926f916ac844
- Local pid:
- pubs:606337
- Source identifiers:
-
606337
- Deposit date:
- 2016-02-25
Terms of use
- Copyright holder:
- International Union of Crystallography
- Copyright date:
- 2016
- Notes:
- Copyright © 2016 International Union of Crystallography.
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