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MICROPROCESSOR CONTROL OF HIGH-TEMPERATURE X-RAY-DIFFRACTION EXPERIMENTS

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APA Style

Cosier, J., Glazer, A., Hastings, T., Smith, D., & Wood, I. (1981). MICROPROCESSOR CONTROL OF HIGH-TEMPERATURE X-RAY-DIFFRACTION EXPERIMENTS. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 14(2), 170–174.

MLA Style

Cosier, J., et al. “MICROPROCESSOR CONTROL OF HIGH-TEMPERATURE X-RAY-DIFFRACTION EXPERIMENTS.” JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, vol. 14, no. 2, 1981, pp. 170–74.

Chicago Style

Cosier, J, A Glazer, T Hastings, D Smith, and I Wood. 1981. “MICROPROCESSOR CONTROL OF HIGH-TEMPERATURE X-RAY-DIFFRACTION EXPERIMENTS.” JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS 14 (2): 170–74.
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Publisher copy:: 10.1088/0022-3735/14/2/010

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+ Cosier, J More by this author

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+ Glazer, A More by this author

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+ Hastings, T More by this author

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+ Smith, D More by this author

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+ Wood, I More by this author

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Bibliographic Details

Journal:: JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS
Volume:: 14
Issue:: 2
Pages:: 170-174
Publication date:: 1981-01-01
DOI:: 10.1088/0022-3735/14/2/010
ISSN:: 0022-3735

Item Description

Pubs id:: pubs:17434
UUID:: uuid:c8709185-8b23-41f5-b8e2-5551dc59b60f
Local pid:: pubs:17434
Source identifiers:: 17434
Deposit date:: 2012-12-19

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Copyright date:: 1981

Licence:: Terms and Conditions of Use for Oxford University Research Archive

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