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High-resolution imaging of surface acoustic wave scattering

Abstract:

We examine the scattering of surface acoustic waves (SAWs) by single dots, periodic and locally damped two-dimensional dot lattices. Employing the scanning acoustic force microscope, SAW fields are imaged with nanometer resolution. We study the influence of a roughly wavelength-sized single dot on SAW diffraction. In order to distinguish between forward- and backscattered components, we insonify the dot with the pump and probe beam under 0° and 90°. We furthermore analyse the SAW diffraction ...

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Publication status:
Published

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Publisher copy:
10.1063/1.1357453

Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Condensed Matter Physics
Role:
Author
Journal:
APPLIED PHYSICS LETTERS More from this journal
Volume:
78
Issue:
13
Pages:
1948-1950
Publication date:
2001-03-26
DOI:
ISSN:
0003-6951
Language:
English
Pubs id:
pubs:151505
UUID:
uuid:c78e6b43-3375-45cd-bc0c-eb25208e7fe0
Local pid:
pubs:151505
Source identifiers:
151505
Deposit date:
2012-12-19

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