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The characterization of metal/ceramic interfaces using specular neutron reflection

Abstract:

We have characterized the chemical composition of three interfaces between metals and a sapphire (Al2O3) single crystal using specular neutron reflection. The interfaces are Sn/sapphire, Sn/sapphire containing a thin, ∼20 nm, Ti interlayer and an interface between sapphire and a Ti-containing Ag-Cu eutectic active braze alloy. We have evaluated the neutron reflection results using a multilayer model of the interface. The technique is extremely sensitive to the presence of Ti at the interface ...

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Publication status:
Published

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Authors


Webster, J More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Chemistry, Physical and Theoretical Chem
Journal:
ACTA MATERIALIA
Volume:
45
Issue:
1
Pages:
273-279
Publication date:
1997-01-05
DOI:
ISSN:
1359-6454
URN:
uuid:c6f61f35-f258-4a82-b771-4a46a2f70cb2
Source identifiers:
121792
Local pid:
pubs:121792
Language:
English

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