Femtosecond X-ray diffraction measurement of a solid-solid phase transition in VO2

Cavalleri, A; Toth, C; Siders, CW; Squier, JA; Raksi, F; Forget, P; Kieffer, JC

Abstract:

Femtosecond x-rays were for the first time used to probe a photoinduced solid-solid phase transition in VO2. The fast timescale observed suggests that, in this regime, the structural distortion may not be thermally initiated.

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APA Style

Cavalleri, A., Toth, C., Siders, C. W., Squier, J. A., Raksi, F., Forget, P., & Kieffer, J. C. (2003). Femtosecond X-ray diffraction measurement of a solid-solid phase transition in VO2. 71, 33–35.

MLA Style

Cavalleri, A., et al. Femtosecond X-Ray Diffraction Measurement of a Solid-Solid Phase Transition in VO2. 2003, pp. 33–35.

Chicago Style

Cavalleri, A, C Toth, CW Siders, JA Squier, F Raksi, P Forget, and JC Kieffer. 2003. “Femtosecond X-Ray Diffraction Measurement of a Solid-Solid Phase Transition in VO2.” In , 71:33–35.
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Authors

+ Cavalleri, A More by this author

Institution:

University of Oxford

Department:

Oxford, MPLS, Physics, Atomic and Laser Physics, REF-Physics

Toth, C More by this author

Siders, CW More by this author

Squier, JA More by this author

Raksi, F More by this author

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Bibliographic Details

Volume:: 71
Pages:: 33-35
Publication date:: 2003
URN:: uuid:c6de8f82-a3cc-4ed2-946e-19e6b628d40b
Source identifiers:: 29763
Local pid:: pubs:29763

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