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Transmission electron microscopy study of the Fe(001)vertical bar MgO(001) interface for magnetic tunnel junctions

Abstract:

Transmission electron microscopy (TEM) is employed to characterize ex situ the interface between the bottom Fe (001) electrode and MgO (001) barrier in a magnetic tunnel junction (MTJ) deposited by molecular beam epitaxy. High resolution TEM images are compared with multislice-based simulations of oxidized and sharp interfaces to conclude that at least the part of the interface is not oxidized. In addition, the, spacing between the Fe and O layers at the interface is measured and found to be ...

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Publication status:
Published

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Publisher copy:
10.1109/TMAG.2007.893694

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Volume:
43
Issue:
6
Pages:
2779-2781
Publication date:
2007-06-05
DOI:
ISSN:
0018-9464
URN:
uuid:c6ab7995-f3c1-4970-b956-deb8c40cf2f2
Source identifiers:
31138
Local pid:
pubs:31138

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