Conference item
Transmission electron microscopy study of the Fe(001)vertical bar MgO(001) interface for magnetic tunnel junctions
- Abstract:
-
Transmission electron microscopy (TEM) is employed to characterize ex situ the interface between the bottom Fe (001) electrode and MgO (001) barrier in a magnetic tunnel junction (MTJ) deposited by molecular beam epitaxy. High resolution TEM images are compared with multislice-based simulations of oxidized and sharp interfaces to conclude that at least the part of the interface is not oxidized. In addition, the, spacing between the Fe and O layers at the interface is measured and found to be ...
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- Publication status:
- Published
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- Publisher copy:
- 10.1109/TMAG.2007.893694
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Bibliographic Details
- Journal:
- IEEE TRANSACTIONS ON MAGNETICS
- Volume:
- 43
- Issue:
- 6
- Pages:
- 2779-2781
- Publication date:
- 2007-06-01
- Event title:
- 10th Joint Magnetism and Magnetic Materials Conference/International Magnetics Conference
- DOI:
- ISSN:
-
0018-9464
- Source identifiers:
-
31138
Item Description
- Keywords:
- Pubs id:
-
pubs:31138
- UUID:
-
uuid:c6ab7995-f3c1-4970-b956-deb8c40cf2f2
- Local pid:
- pubs:31138
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 2007
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