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A technique for field effect surface passivation for silicon solar cells

Abstract:

The recombination of electric charge carriers at the surface of semiconductors is a major limiting factor in the efficiency of optoelectronic devices, in particular, solar cells. The reduction of such recombination, commonly referred to as surface passivation, is achieved by the combined effect of a reduction in the trap states present at the surface via a chemical component, and the reduction in the charge carriers available for a recombination process, via a field effect component. Here, we...

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Publication status:
Published

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Publisher copy:
10.1063/1.4882161

Authors


Bonilla, RS More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Publisher:
American Institute of Physics Inc.
Journal:
APPLIED PHYSICS LETTERS
Volume:
104
Issue:
23
Pages:
232903-232903
Publication date:
2014-06-09
DOI:
EISSN:
1077-3118
ISSN:
0003-6951
URN:
uuid:c58c7c44-7163-4790-aaa7-f62271351401
Source identifiers:
477887
Local pid:
pubs:477887
Language:
English

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