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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy

Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1007/978-3-540-85156-1

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Publisher:
Springer Berlin Heidelberg Publisher's website
Volume:
1
Pages:
139-140
Host title:
EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany. Instrumentation and Methods
Publication date:
2008-01-01
DOI:
ISBN:
9783540851561
Language:
English
Keywords:
Subjects:
UUID:
uuid:c1f8f966-a855-4a97-9438-82a5722a7afe
Local pid:
ora:3454
Deposit date:
2010-03-04

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