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SCANNING ACOUSTIC FORCE MICROSCOPE DETECTION OF SAWS

Abstract:

We present a novel method for the investigation of surface acoustic wave (SAW) fields with nanometer resolution by a scanning acoustic force microscope (SAFM). The detection of ultrasound by a force microscope is connected with the nonlinear dependence of the force on the distance between the tip and the surface. Due to this nonlinearity there is an effective shift of the mean position of the tip if one modulates the gap distance by a propagating SAW. Furthermore, the surface charges influenc...

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Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Condensed Matter Physics
Role:
Author
Volume:
1
Pages:
363-366
Host title:
1994 IEEE ULTRASONICS SYMPOSIUM PROCEEDINGS, VOLS 1-3
Publication date:
1994-01-01
ISSN:
1051-0117
Source identifiers:
151665
ISBN:
0780320123
Pubs id:
pubs:151665
UUID:
uuid:c0da025a-4b6b-431b-b397-ae329314dba1
Local pid:
pubs:151665
Deposit date:
2012-12-19

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