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Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale

Abstract:

A novel method is presented for the assessment of the Poisson's ratio and residual stress on the micron scale, based on focused ion beam (FIB) two-step four-slot micro-milling and in-situ digital image correlation (DIC) analysis of the induced relaxation strains at the specimen's surface.The methodology has been fully validated through modelling and experiments on three different materials, namely, physical vapour deposition (PVD) chromium nitride (CrN), and as-deposited and annealed Cu thin ...

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Authors


Sebastiani, M More by this author
Bemporad, E More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Engineering Science
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Publisher:
Elsevier
Journal:
Surface and Coatings Technology
Volume:
251
Pages:
151-161
Publication date:
2014-07-25
DOI:
ISSN:
0257-8972
URN:
uuid:b9165351-cd99-47a2-a354-c5c42e0fdb79
Source identifiers:
470254
Local pid:
pubs:470254
Language:
English
Keywords:

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