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Journal article

CYCLOTRON-RESONANCE MEASUREMENTS ON P-TYPE STRAINED-LAYER SI1-XGEX/SI HETEROSTRUCTURES

Publication status:
Published

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Publisher copy:
10.1103/PhysRevB.51.13499

Authors


Journal:
PHYSICAL REVIEW B
Volume:
51
Issue:
19
Pages:
13499-13502
Publication date:
1995-05-15
DOI:
EISSN:
1095-3795
ISSN:
0163-1829
URN:
uuid:b81e6d6b-75aa-46ac-8550-ede6d641ae95
Source identifiers:
2838
Local pid:
pubs:2838

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