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Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution.

Abstract:

We demonstrate a method to achieve high efficiency phase contrast imaging in aberration corrected scanning transmission electron microscopy (STEM) with a pixelated detector. The pixelated detector is used to record the Ronchigram as a function of probe position which is then analyzed with ptychography. Ptychography has previously been used to provide super-resolution beyond the diffraction limit of the optics, alongside numerically correcting for spherical aberration. Here we rely on a hardwa...

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Authors


Pennycook, TJ More by this author
Lupini, AR More by this author
Murfitt, MF More by this author
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Journal:
Ultramicroscopy
Publication date:
2014-10-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:b6dc790d-67b2-4026-a3ee-52932c175eca
Source identifiers:
493178
Local pid:
pubs:493178

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