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Journal article

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING

Publication status:
Published

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Journal:
INSTITUTE OF PHYSICS CONFERENCE SERIES
Issue:
117
Pages:
771-774
Publication date:
1991-01-01
ISSN:
0951-3248
Source identifiers:
26331
Pubs id:
pubs:26331
UUID:
uuid:b6c13407-d32b-48b8-a39a-a16296fbb0d5
Local pid:
pubs:26331
Deposit date:
2012-12-19

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