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Band-gap shrinkage in n-type-doped CdO probed by photoemission spectroscopy

Abstract:
The influence of n-type doping CdO with In or Y has been investigated by high-resolution ultraviolet and x-ray photoemission spectroscopy. It is found that core levels and valence band features suffer a shift to high binding energy due to doping. However this shift is less than the change in the width of the occupied conduction band. This provides a direct measurement of band gap shrinkage as a result of doping in an oxide semiconductor.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Chemistry
Sub department:
Inorganic Chemistry
Role:
Author
Journal:
Physical Review B More from this journal
Volume:
55
Issue:
20
Pages:
13381-13384
Publication date:
1997-05-15
ISSN:
0163-1829
Language:
English
Pubs id:
pubs:45623
UUID:
uuid:b438c900-58a6-4c84-93a0-aba3e2487edf
Local pid:
pubs:45623
Source identifiers:
45623
Deposit date:
2012-12-19

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