Journal article
Band-gap shrinkage in n-type-doped CdO probed by photoemission spectroscopy
- Abstract:
- The influence of n-type doping CdO with In or Y has been investigated by high-resolution ultraviolet and x-ray photoemission spectroscopy. It is found that core levels and valence band features suffer a shift to high binding energy due to doping. However this shift is less than the change in the width of the occupied conduction band. This provides a direct measurement of band gap shrinkage as a result of doping in an oxide semiconductor.
- Publication status:
- Published
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Bibliographic Details
- Journal:
- Physical Review B More from this journal
- Volume:
- 55
- Issue:
- 20
- Pages:
- 13381-13384
- Publication date:
- 1997-05-15
- ISSN:
-
0163-1829
Item Description
- Language:
-
English
- Pubs id:
-
pubs:45623
- UUID:
-
uuid:b438c900-58a6-4c84-93a0-aba3e2487edf
- Local pid:
-
pubs:45623
- Source identifiers:
-
45623
- Deposit date:
-
2012-12-19
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- Copyright date:
- 1997
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