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Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis.

Abstract:

X-ray diffraction contrast tomography (DCT) is a technique for mapping grain shape and orientation in plastically undeformed polycrystals. In this paper, we describe a modified DCT data acquisition strategy which permits the incorporation of an innovative Friedel pair method for analyzing diffraction data. Diffraction spots are acquired during a 360 degree rotation of the sample and are analyzed in terms of the Friedel pairs ((hkl) and (hkl -) reflections, observed 180 degrees apart in rotati...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher's version

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Publisher copy:
10.1063/1.3100200

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Publisher:
American Institute of Physics Publisher's website
Journal:
The Review of scientific instruments Journal website
Volume:
80
Issue:
3
Pages:
033905
Publication date:
2009-03-05
DOI:
EISSN:
1089-7623
ISSN:
0034-6748
URN:
uuid:b3665456-f073-4d79-8a42-6d2fe59c84cd
Source identifiers:
177462
Local pid:
pubs:177462

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