- Abstract:
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X-ray diffraction contrast tomography (DCT) is a technique for mapping grain shape and orientation in plastically undeformed polycrystals. In this paper, we describe a modified DCT data acquisition strategy which permits the incorporation of an innovative Friedel pair method for analyzing diffraction data. Diffraction spots are acquired during a 360 degree rotation of the sample and are analyzed in terms of the Friedel pairs ((hkl) and (hkl -) reflections, observed 180 degrees apart in rotati...
Expand abstract - Publication status:
- Published
- Peer review status:
- Peer reviewed
- Version:
- Publisher's version
- Files:
-
-
(pdf, 747.2KB)
-
- Publisher copy:
- 10.1063/1.3100200
-
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- Publisher:
- American Institute of Physics Publisher's website
- Journal:
- The Review of scientific instruments Journal website
- Volume:
- 80
- Issue:
- 3
- Pages:
- 033905
- Publication date:
- 2009-03-05
- DOI:
- EISSN:
-
1089-7623
- ISSN:
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0034-6748
- URN:
-
uuid:b3665456-f073-4d79-8a42-6d2fe59c84cd
- Source identifiers:
-
177462
- Local pid:
- pubs:177462
- Language:
- English
- Keywords:
- Copyright holder:
- American Institute of Physics
- Copyright date:
- 2009
- Notes:
- Copyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Rev. Sci. Instrum. 80, 033905 (2009) and may be found at http://link.aip.org/link/?rsi/80/033905
Journal article
Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis.
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