Conference item
IMAGING OF SEMICONDUCTOR DEFECTS USING ION CHANNELING
- Publication status:
- Published
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Bibliographic Details
- Journal:
- MICROSCOPY OF SEMICONDUCTING MATERIALS 1993
- Issue:
- 134
- Pages:
- 153-156
- Publication date:
- 1993-01-01
- Event title:
- 8th Royal-Microscopical-Society Conference: Microscopy of Semiconducting Materials 1993 (MSM VIII)
- ISSN:
-
0951-3248
- Source identifiers:
-
23190
- ISBN:
- 0750302909
Item Description
- Keywords:
- Pubs id:
-
pubs:23190
- UUID:
-
uuid:b2f586ad-77ef-410d-978e-4d0c09c18e38
- Local pid:
- pubs:23190
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 1993
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