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Atom probe tomography today

Abstract:

This review aims to describe and illustrate the advances in the application of atom probe tomography that have been made possible by recent developments, particularly in specimen preparation techniques (using dual-beam focused-ion beam instruments) but also of the more routine use of laser pulsing. The combination of these two developments now permits atomic-scale investigation of site-specific regions within engineering alloys (e.g. at grain boundaries and in the vicinity of cracks) and also...

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Publication status:
Published
Peer review status:
Peer reviewed
Version:
Publisher version

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Publisher copy:
10.1016/S1369-7021(07)70306-1

Authors


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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Clifton, PH More by this author
Galtrey, MJ More by this author
Humphreys, CJ More by this author
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Publisher:
Elsevier B.V. Publisher's website
Journal:
MATERIALS TODAY Journal website
Volume:
10
Issue:
12
Pages:
36-42
Publication date:
2007-12-05
DOI:
ISSN:
1369-7021
URN:
uuid:b2c6e145-f43c-4c84-b516-fb47beaa65ea
Source identifiers:
15746
Local pid:
pubs:15746
Language:
English

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