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Achieving sub-nanometre particle mapping with energy-filtered TEM.

Abstract:

A combination of state-of-the-art instrumentation and optimized data processing has enabled for the first time the chemical mapping of sub-nanometre particles using energy-filtered transmission electron microscopy (EFTEM). Multivariate statistical analysis (MSA) generated reconstructed datasets where the signal from particles smaller than 1 nm in diameter was successfully isolated from the original noisy background. The technique has been applied to the characterization of oxide dispersion st...

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Publication status:
Published

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Institution:
University of Oxford
Department:
Oxford, MPLS, Materials
Role:
Author
Journal:
Ultramicroscopy
Volume:
109
Issue:
10
Pages:
1217-1228
Publication date:
2009-09-05
DOI:
EISSN:
1879-2723
ISSN:
0304-3991
URN:
uuid:b2324e55-2135-4056-9af7-4c7cfd0549cd
Source identifiers:
172967
Local pid:
pubs:172967
Language:
English
Keywords:

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