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Layer selective magnetometry in ultrathin magnetic structures by polarised neutron reflection

Abstract:

We discuss the application of polarised neutron reflection to layer selective vector magnetometry measurements in thin magnetic films. To illustrate the application of PNR, we review recent measurements of the absolute moment in X/Fe/Ag(001) structures with X = Pd, Ag, Au and Cu and compare the results with the predictions based on theoretical calculations which take into account the measured interface roughness. For the case of strained fct Ni/Cu(001) structures we illustrate the use of PNR ...

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Publication status:
Published

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Authors


Bland, JAC More by this author
Lauhoff, G More by this author
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Institution:
University of Oxford
Department:
Oxford, MPLS, Chemistry, Physical and Theoretical Chem
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Volume:
165
Issue:
1-3
Pages:
46-51
Publication date:
1997-01-05
DOI:
ISSN:
0304-8853
URN:
uuid:b06de0ca-e09c-462a-9c8c-b6ff0156dc4f
Source identifiers:
121790
Local pid:
pubs:121790

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