Conference item
Residual strain measurement by synchrotron diffraction
- Abstract:
-
Third generation synchrotron X-ray sources such as the European Synchrotron Radiation Facility and the Advanced Photon Source (USA) have made very intense beams of very high energy X-rays available for the first time. At energies in excess of 60 keV penetration lengths of the order of centimetres are possible in most engineering materials. The associated low scattering angles limit the strain measurement directions available at depth. Gauge dimensions as small as microns and sub-second measur...
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- Publication status:
- Published
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Bibliographic Details
- Volume:
- 404-7
- Pages:
- 1-10
- Host title:
- ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES
- Publication date:
- 2002-01-01
- ISSN:
-
0255-5476
- Source identifiers:
-
63143
- ISBN:
- 0878499008
Item Description
- Keywords:
- Pubs id:
-
pubs:63143
- UUID:
-
uuid:aeba1a83-b28a-4cbb-8483-4f05cc1a882e
- Local pid:
- pubs:63143
- Deposit date:
- 2012-12-19
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- Copyright date:
- 2002
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