- Abstract:
-
The residual impression after performing a microhardness indent in silicon has been mapped with high resolution EBSD to reveal residual elastic strain and lattice rotation fields. Mapping of the same area has been performed with variable pattern binning and exposure times to reveal the qualitative and quantitative differences resulting from reducing the pattern size and exposure time. Two dimension 'image' plots of these fields indicate that qualitative assessment of the shape and size of the...
Expand abstract - Publisher copy:
- 10.1016/j.ultramic.2013.08.006
-
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- Journal:
- Ultramicroscopy
- Volume:
- 135
- Pages:
- 136-141
- Publication date:
- 2013-12-05
- DOI:
- EISSN:
-
1879-2723
- ISSN:
-
0304-3991
- URN:
-
uuid:aba62fbf-480e-45ad-9aee-3aa149c237b7
- Source identifiers:
-
439282
- Local pid:
- pubs:439282
- Language:
- English
- Keywords:
- Copyright date:
- 2013
Journal article
Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
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