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Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.

Abstract:

Aberration correction leads to reduced focal depth of field in the electron microscope. This reduced depth of field can be exploited to probe specific depths within a sample, a process known as optical sectioning. An electron microscope fitted with aberration correctors for both the pre- and postspecimen optics can be used in a confocal mode that provides improved depth resolution and selectivity over optical sectioning in the scanning transmission electron microscope (STEM). In this article ...

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Publication status:
Published

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Publisher copy:
10.1017/S1431927608080057

Authors


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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada More from this journal
Volume:
14
Issue:
1
Pages:
82-88
Publication date:
2008-02-01
Event title:
Pre Meeting Congress on Materials Research in an Aberration-Free Evironment
DOI:
EISSN:
1435-8115
ISSN:
1431-9276
Keywords:
Pubs id:
pubs:28680
UUID:
uuid:aad404c5-b2d5-4522-8161-3857b3e5267e
Local pid:
pubs:28680
Source identifiers:
28680
Deposit date:
2012-12-19

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