Transmission electron microscopy is an extremely powerful technique for direct characterization of local structure at the atomic scale. However, the resolution of this technique is fundamentally limited by the partial coherence of the electron beam. In this Letter we demonstrate a method that extends the ultimate resolution of the latest generation of aberration corrected transmission electron microscopes by 41% relative to that achievable using conventional axial imaging. Experimental result...Expand abstract
- Publication status:
- Publisher copy:
- Copyright date:
Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope.
If you are the owner of this record, you can report an update to it here: Report update to this record