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Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope.

Abstract:

Transmission electron microscopy is an extremely powerful technique for direct characterization of local structure at the atomic scale. However, the resolution of this technique is fundamentally limited by the partial coherence of the electron beam. In this Letter we demonstrate a method that extends the ultimate resolution of the latest generation of aberration corrected transmission electron microscopes by 41% relative to that achievable using conventional axial imaging. Experimental result...

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Publication status:
Published

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Authors


Kirkland, AI More by this author
Journal:
Physical review letters
Volume:
103
Issue:
12
Pages:
126101
Publication date:
2009-09-05
DOI:
EISSN:
1079-7114
ISSN:
0031-9007
URN:
uuid:a9f5c72c-1563-4590-b564-07c90370084d
Source identifiers:
15633
Local pid:
pubs:15633
Language:
English

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